O.C. Wells, T.E. Everhart, et al.
IEEE T-ED
Paper
Penetration effect at sharp edges in the scanning electron microscope
Abstract
No abstract available.
Related
O.C. Wells, C.G. Bremer
Journal of Physics E: Scientific Instruments
J.P. Jakubovics, O.C. Wells
Journal of Magnetism and Magnetic Materials
O.C. Wells
Scanning