PaperAutomatic Positioning of Device Electrodes Using the Scanning Electron MicroscopeO.C. Wells, T.E. Everhart, et al.IEEE T-ED
PaperBackscattered electron imaging in the scanning electron microscope: The use of either: (A) high incident energy or (b) an array detectorL. Gignac, O.C. Wells, et al.Microscopy and Microanalysis
Conference paperExplanation of the high resolution backscattered electron image in the scanning electron microscope by the twin-population theory - a historical reviewO.C. WellsMSA Annual Meeting 1993
Conference paperIn-lens magnetically filtered detector for scanning electron microscopeO.C. Wells, E. Munro, et al.Institute of Physics Electron Microscopy and Analysis Group Conference 1991
