PaperImproved energy analyser for the scanning electron microscopeO.C. Wells, C.G. BremerJournal of Physics E: Scientific Instruments
PaperCoating, mechanical constraints, and pressure effects on electromigrationN.G. Ainslie, F.M. D'Heurle, et al.Applied Physics Letters
Conference paperExplanation of the high resolution backscattered electron image in the scanning electron microscope by the twin-population theory - a historical reviewO.C. WellsMSA Annual Meeting 1993
