Conference paper
Characterization of a next generation step-and-scan system
Timothy J. Wiltshire, Joseph P. Kirk, et al.
SPIE Advanced Lithography 1998
Two algorithms are presented and analyzed, which compute the distance between any pair of leaves of a complete tree. The first algorithm is quite efficient, running in time 0(log2 distance) on a uniform-cost RAM. The second algorithm is somewhat less efficient, though it too runs on a uniform-cost RAM in time O(log2 distance); it is presented mainly because its validity depends on an interesting numerological descriptor of complete trees. © 1980, Taylor & Francis Group, LLC
Timothy J. Wiltshire, Joseph P. Kirk, et al.
SPIE Advanced Lithography 1998
M. Shub, B. Weiss
Ergodic Theory and Dynamical Systems
Ronen Feldman, Martin Charles Golumbic
Ann. Math. Artif. Intell.
Elizabeth A. Sholler, Frederick M. Meyer, et al.
SPIE AeroSense 1997