Proceedings of SPIE 1989
Conference paper

Novolac based deep-uv resists

View publication


This paper describes the results obtained from studies of deep-UV lithographic properties of resists which utilize chemical amplification in novolac resins. These studies have shown that three-component novolac-based systems are surprisingly effective as deep-UV resists despite the high opacity of novolac at 254 nm. Analytical results are described which have measured the amount of Bronsted acid produced in chemical amplification resist films. The minimum acid concentration necessary for acceptable dissolution rates is far less than the corresponding active species content necessary for the proper functioning of diazoketone-novolac deep-UV resists. © 1988, SPIE. Downloading of the abstract is permitted for personal use only. All rights reserved. © 1988 SPIE publishing Ltd.