Publication
VLSI-TSA 2015
Conference paper

Moving from thin films to atomic layers - Atomic layer etching

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Abstract

Controlled layer by layer material removal will be required for device fabrication in the future. Atomic level etch is a promising path to answer the processing demands of thin high mobility channel devices on the angstrom scale. Self-limiting reactions, discrete reaction & activation steps, or extremely low ion energy etch plasmas are some of the pathways being pursued for precise sub-nanometer material removal. Critical etch applications that require atomic layer control will be discussed, and promising approaches towards atomic layer etch will be reviewed in this talk.

Date

03 Jun 2015

Publication

VLSI-TSA 2015

Authors

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