Conference paper
The early history and future of the SEM
Oliver C. Wells, David C. Joy
Surface and Interface Analysis
Paper
Method for measuring the field from a magnetic recording head in the scanning electron microscope
Abstract
No abstract available.
Related
Oliver C. Wells, Conrad G. Bremer
Review of Scientific Instruments
Kenneth C.A. Smith, Oliver C. Wells, et al.
IC-CPO 2006
Oliver C. Wells, Matthias Brunner
Applied Physics Letters