Journal of Microscopy

Paper

02 Aug 2011

Method for measuring the field from a magnetic recording head in the scanning electron microscope

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Abstract

No abstract available.

Paper

Comparison of different models for the generation of electron backscattering patterns in the scanning electron microscope

Oliver C. Wells

Scanning

Paper

Magnetic Domains in Thin-Film Recording Heads as Observed in the SEM by a Lock-In Technique

Oliver C. Wells, Richard J. Savoy

IEEE Transactions on Magnetics

Conference paper

The fiftieth anniversary of the first applications of the scanning electron microscope in materials research

Kenneth C.A. Smith, Oliver C. Wells, et al.

IC-CPO 2006

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Discussion of ways to energy-filter the electron backscattering pattern (EBSP) in the scanning electron microscope (SEM)

Oliver C. Wells

Microscopy and Microanalysis

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