PaperExamining deep holes by rocking the beam in the scanning electron microscopeOliver C. WellsReview of Scientific Instruments
PaperUse of backscattered electron detector arrays for forming backscattered electron images in the scanning electron microscopeOliver C. Wells, L. Gignac, et al.Scanning
ReviewEffects of collector take‐off angle and energy filtering on the BSE image in the SEMOliver C. WellsScanning
Conference paperThe fiftieth anniversary of the first applications of the scanning electron microscope in materials researchKenneth C.A. Smith, Oliver C. Wells, et al.IC-CPO 2006
