PaperSchlieren method as applied to magnetic recording heads in the scanning electron microscopeOliver C. Wells, Matthias BrunnerApplied Physics Letters
PaperUse of backscattered electron detector arrays for forming backscattered electron images in the scanning electron microscopeOliver C. Wells, L. Gignac, et al.Scanning
PaperSome theoretical aspects of type‐1 magnetic contrast in the scanning electron microscopeOliver C. WellsJournal of Microscopy
PaperTop-down topography of deeply etched silicon in the scanning electron microscopeOliver C. Wells, Conal E. Murray, et al.Review of Scientific Instruments
