Annual Review of Materials Science
Paper
01 Jan 1990

Mechanical properties of thin films

View publication

Abstract

No abstract available.

Related

Paper

Soft x-ray investigation of the effect of growth conditions on InAs/GaAs heterostructures

A. Krol, C.J. Sher, et al.

Surface Science

Paper

Electrochemical characterization of adsorption-desorption of the cuprous-suppressor-chloride complex during electrodeposition of copper

John G. Long, Peter C. Searson, et al.

JES

Conference paper

NEW RELIABLE STRUCTURE FOR HIGH TEMPERATURE MEASUREMENT OF SILICON WAFERS USING A SPECIALLY ATTACHED THERMOCOUPLE.

S. Cohen, T.O. Sedgwick, et al.

MRS Proceedings 1983

Paper

Theory of temperature-induced Mott transitions

Ellen J. Yoffa, David Adler

Physical Review B

View all publications
  1. Home
  2. ↳ Publications

Date

01 Jan 1990

Publication

Annual Review of Materials Science

Authors

  • P.S. Alexopoulos
  • T.C. O'Sullivan
IBM-affiliated at time of publication

Topics

  • Physical Sciences

Resources

  • Publication

Share