Pong-Fei Lu, Keith A. Jenkins, et al.
IRPS 2015
Paper
Measurement of VLSI Power Supply Current by Electron-Beam Probing
Abstract
The measurement of power supply noise and current by electron-beam probing is described. Noise measurements can be made on the chip under test, and current measurements can be made on the circuit board. © 1992 IEEE
Related
Conference paper
A shorted global clock design for multi-GHz 3D stacked chips
Liang-Teck Pang, Phillip J. Restle, et al.
VLSI Circuits 2012
Keith A. Jenkins, Pong-Fei Lu
Microelectronics Reliability
Keith A. Jenkins, Alan J. Weger
IEEE Electron Device Letters