Matt Wetzel, Leathen Shi, et al.
IEEE Microwave and Guided Wave Letters
The measurement of power supply noise and current by electron-beam probing is described. Noise measurements can be made on the chip under test, and current measurements can be made on the circuit board. © 1992 IEEE
Matt Wetzel, Leathen Shi, et al.
IEEE Microwave and Guided Wave Letters
Keith A. Jenkins
IEEE SSC-L
Chirag S. Patel, Paul S. Andry, et al.
IITC 2005
Keith A. Jenkins, Woogeun Rhee, et al.
SiRF 2006