Mark B. Ketchen, Manjul Bhushan, et al.
IEEE International SOI Conference 2005
Paper
Measurement of VLSI Power Supply Current by Electron-Beam Probing
Abstract
The measurement of power supply noise and current by electron-beam probing is described. Noise measurements can be made on the chip under test, and current measurements can be made on the circuit board. © 1992 IEEE
Related
Yu-Ming Lin, Keith A. Jenkins, et al.
IMS 2011
Woogeun Rhee, Keith A. Jenkins, et al.
IEEE TCAS-II
Keith A. Jenkins, David F. Heidel
Microelectronic Engineering