Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Paper
Mapping of short-range adhesive forces by scanning tunneling microscopy
Abstract
Detection of short-range interactions in combination with tunneling microscopy provides a means for characterizing the chemical nature of surfaces. Results are presented that demonstrate that carbon adsorbed on a rough, polycrystalline Ir surface can be detected on an atomic level. © 1994 The American Physical Society.
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