Yu Lu, X.W. Li, et al.
Journal of Applied Physics
The CrO2 thin films epitaxially on TiO2(100) and Al2O3(0001) substrates were successively grown. The films have been structurally characterized using ex situ RHEED, X-ray diffraction and ion channeling spectroscopy. A Curie temperature of around 393 K is observed for the films, with those grown on TiO2 exhibiting a large magneto-crystalline anisotropy. Transport measurements show that films on TiO2 have a resistivity drop of about two orders upon cooling down from room temperature to 5 K.
Yu Lu, X.W. Li, et al.
Journal of Applied Physics
J.Z. Sun, L. Krusin-Elbaum, et al.
IBM J. Res. Dev
X.W. Li, A. Gupta, et al.
Applied Physics Letters
T.S. Plaskett, T.R. McGuire, et al.
Journal of Applied Physics