William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
The magnetization measurement on the nanometer scale was discussed. The magnetic tip of a magnetic force microscope within the point-probe approximation was calibrated. The calibration was proved for determining quantitatively a hysteresis loop for the single magnetic dot with perpendicular magnetic anisotropy.
William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
R. Ghez, M.B. Small
JES
Q.R. Huang, Ho-Cheol Kim, et al.
Macromolecules
A. Gangulee, F.M. D'Heurle
Thin Solid Films