P. Martensson, R.M. Feenstra
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
The magnetization measurement on the nanometer scale was discussed. The magnetic tip of a magnetic force microscope within the point-probe approximation was calibrated. The calibration was proved for determining quantitatively a hysteresis loop for the single magnetic dot with perpendicular magnetic anisotropy.
P. Martensson, R.M. Feenstra
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Thomas E. Karis, C. Mark Seymour, et al.
Rheologica Acta
T.N. Morgan
Semiconductor Science and Technology
D.D. Awschalom, J.-M. Halbout
Journal of Magnetism and Magnetic Materials