Paper
The DX centre
T.N. Morgan
Semiconductor Science and Technology
We have used linearly and circularly polarized X-rays to determine the magnetic properties of several TbxFe1-x amorphous films. Absorption measurements on the M4.5 edges of Tb and the L2.3 edges of Fe allowed us to obtain information about the size and direction of local magnetic moments. Our results confirm that linear dichorism in rare earth M4.5 edges can give useful information about both crystal field and magnetic effects. © 1995.
T.N. Morgan
Semiconductor Science and Technology
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
Lawrence Suchow, Norman R. Stemple
JES
Michiel Sprik
Journal of Physics Condensed Matter