Kumar Virwani, Sara E. Harrison, et al.
Applied Physics Letters
We report the structural and magnetic study of Cr-doped Bi2Se3 thin films using x-ray diffraction (XRD), magnetometry and polarized neutron reflectometry (PNR). Epitaxial layers were grown on c-plane sapphire by molecular beam epitaxy in a two-step process. High-resolution XRD shows the exceptionally high crystalline quality of the doped films with no parasitic phases up to a Cr concentration of 12% (in % of the Bi sites occupied by substitutional Cr). The magnetic moment, measured by SQUID magnetometry, was found to be ∼2.1 μB per Cr ion. The magnetic hysteresis curve shows an open loop with a coercive field of ∼10 mT. The ferromagnetic transition temperature was determined to be analyzing the magnetization-temperature gradient. PNR shows the film to be homogeneously ferromagnetic with no enhanced magnetism near the surface or interface.
Kumar Virwani, Sara E. Harrison, et al.
Applied Physics Letters
Liam Collins-McIntyre, M.D. Watson, et al.
AIP Advances
Sara E. Harrison, Liam Collins-McIntyre, et al.
Scientific Reports
Sara E. Harrison, Liam Collins-McIntyre, et al.
Journal of Physics Condensed Matter