High density data storage based on the atomic force microscope
H.J. Mamin, R.P. Ried, et al.
INVMTC 1998
Low-stiffness silicon cantilevers have been developed for proposed data storage devices based on the atomic force microscope, in particular thermomechanical recording. The cantilevers combine a sharp tip with an integrated piezoresistive sensor for data readback from a rotating polycarbonate disk. A novel process was developed to make shallow piezoresistors in cantilevers 1 μm thick, significantly thinner and therefore softer than previously possible. Readback was demonstrated at linear velocities up to 120 mm/s. Separate cantilevers with resistively heated tips were fabricated for writing data marks on polycarbonate, with measured thermal time constants of 30 μs. © 1996 American Institute of Physics.
H.J. Mamin, R.P. Ried, et al.
INVMTC 1998
D. Rugar, B.C. Stipe, et al.
Applied Physics A: Materials Science and Processing
T.D. Stowe, T.W. Kenny, et al.
Applied Physics Letters
B.C. Stipe, H.J. Mamin, et al.
Physical Review Letters