Publications

18 results for B.W. Chui

Patterned cracks improve yield in the release of compliant microdevices from silicon-on-insulator wafers
- - G.C. Hill
  - J.I. Padovani
  - et al.
- 2011
- JMM
Patterned cracks in the buried oxide layer improve yield in device release from soi wafers
- - G.C. Hill
  - J.I. Padovani
  - et al.
- 2011
- MEMS 2011
Magnetic resonance force microscopy of nuclear spins: Detection and manipulation of statistical polarization
- - H.J. Mamin
  - R. Budakian
  - et al.
- 2005
- Physical Review B - CMMP
Creating order from random fluctuations in small spin ensembles
- - R. Budakian
  - H.J. Mamin
  - et al.
- 2005
- Science
Single spin detection by magnetic resonance force microscopy
- - D. Rugar
  - R. Budakian
  - et al.
- 2004
- Nature
Detection and manipulation of statistical polarization in small spin ensembles
- - H.J. Mamin
  - R. Budakian
  - et al.
- 2003
- Physical Review Letters
"Feeling" the noise in nanoscale systems: Studies based on ultrasensitive force detection
- - D. Rugar
  - R. Budakian
  - et al.
- 2003
- SPIE International Symposium on Fluctuations and Noise 2003
"Feeling" the noise in nanoscale systems: Studies based on ultrasensitive force detection
- - D. Rugar
  - R. Budakian
  - et al.
- 2003
- SPIE International Symposium on Fluctuations and Noise 2003
"Feeling" the noise in nanoscale systems: Studies based on ultrasensitive force detection
- - D. Rugar
  - R. Budakian
  - et al.
- 2003
- SPIE International Symposium on Fluctuations and Noise 2003
Mass-loaded cantilevers with suppressed higher-order modes for magnetic resonance force microscopy
- - B.W. Chui
  - Y. Hishinuma
  - et al.
- 2003
- TRANSDUCERS 2003