About cookies on this site Our websites require some cookies to function properly (required). In addition, other cookies may be used with your consent to analyze site usage, improve the user experience and for advertising. For more information, please review your options. By visiting our website, you agree to our processing of information as described in IBM’sprivacy statement. To provide a smooth navigation, your cookie preferences will be shared across the IBM web domains listed here.
Publication
Applied Physics Letters
Paper
Low-energy photoionization cross sections from proton-induced x-ray spectroscopy
Abstract
It is shown that photoionization cross sections in the soft-x-ray region can be determined accurately with proton-induced x-ray spectroscopy. A film of the absorber is evaporated onto a substrate. The characteristic substrate radiation, generated with a proton beam, is measured with and without the absorber. The ionization cross section can then be calculated after a small and often negligible correction is made for the intensity change of the substrate radiation due to the energy loss of the proton beam passing through the absorber.