PaperCharacteristic and noncharacteristic x rays produced during 1-MeV argon bombardment of siliconA. Lurio, J.A. Cairns, et al.Physical Review A
PaperDetermination of the near-surface elemental composition of catalysts by the technique of proton-induced X-ray analysisJ.A. Cairns, A. Lurio, et al.Journal of Catalysis
PaperPreferred orientation in bias-sputtered nickel chromium filmsE. Stern, T.B. LightApplied Physics Letters
