Conference paper
Characterization of line width variation
Alfred K. Wong, Antoinette F. Molless, et al.
SPIE Advanced Lithography 2000
Alfred K. Wong, Antoinette F. Molless, et al.
SPIE Advanced Lithography 2000
Minghong Fang, Zifan Zhang, et al.
CCS 2024
David W. Jacobs, Daphna Weinshall, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence
F. Odeh, I. Tadjbakhsh
Archive for Rational Mechanics and Analysis