Moutaz Fakhry, Yuri Granik, et al.
SPIE Photomask Technology + EUV Lithography 2011
No abstract available.
Moutaz Fakhry, Yuri Granik, et al.
SPIE Photomask Technology + EUV Lithography 2011
David Cash, Dennis Hofheinz, et al.
Journal of Cryptology
David W. Jacobs, Daphna Weinshall, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence
M.B. Small, R.M. Potemski
Proceedings of SPIE 1989