Arnon Amir, Michael Lindenbaum
IEEE Transactions on Pattern Analysis and Machine Intelligence
Arnon Amir, Michael Lindenbaum
IEEE Transactions on Pattern Analysis and Machine Intelligence
Kenneth L. Clarkson, K. Georg Hampel, et al.
VTC Spring 2007
Simeon Furrer, Dirk Dahlhaus
ISIT 2005
Harpreet S. Sawhney
IS&T/SPIE Electronic Imaging 1994