Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
A unification algorithm is described which tests a set of expressions for unifiability and which requires time and space which are only linear in the size of the input. © 1978.
Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
John S. Lew
Mathematical Biosciences
Hans Becker, Frank Schmidt, et al.
Photomask and Next-Generation Lithography Mask Technology 2004