PaperScanning x-ray microscope with 75-nm resolutionH. Rarback, D. Shu, et al.Review of Scientific Instruments
PaperZone plate lenses for X-ray microscopyY. Vladimirsky, D. Kern, et al.Nuclear Inst. and Methods in Physics Research, A
PaperDesign and Experimental Technology for 0.1-μm Gate-Length Low-Temperature Operation FET'sGeorge A. Sai-Halasz, Matthew R. Wordeman, et al.IEEE Electron Device Letters
PaperInvited: The potential of Electron Beam Technology for MicrofabricationT.H.P. ChangJapanese Journal of Applied Physics