H. Rarback, D. Shu, et al.
Review of Scientific Instruments
No abstract available.
H. Rarback, D. Shu, et al.
Review of Scientific Instruments
Warren D. Grobman, Hans E. Luhn, et al.
IEEE JSSC
S. Rishton, D. Kern, et al.
Microelectronic Engineering
T.H.P. Chang
Japanese Journal of Applied Physics