F.A. Geenen, Jean L. Jordan-Sweet, et al.
Journal of Physics D: Applied Physics
The influence of Ni thickness on the formation of Nickel suicides was systematically investigated between 0 and 15nm. Annealing thickness gradients distinguishes Alms that agglomerate (>5nm) and films that are morphologically stable (<5nm). Alloying the initial Ni layer influences this critical thickness to higher (Al, Co) and lower (Ge, Pd, Pt) values. Pole figures and in situ XRD provides information to understand this observed shift in critical thickness.
F.A. Geenen, Jean L. Jordan-Sweet, et al.
Journal of Physics D: Applied Physics
F.A. Geenen, E. Solano, et al.
Journal of Applied Physics
F.A. Geenen, W. Knaepen, et al.
Thin Solid Films
B. De Schutter, K. Van Stiphout, et al.
Journal of Applied Physics