Impact of SOI history effect on random data signals

Abstract

The impact of silicon-on-insulator (SOI) history effect in communication circuits containing delay chains is experimentally evaluated. In previous work, SOI history has been seen to change data pulse widths by 5% to 15 % for fixed data patterns. In contrast, this work shows that data scrambling and dc balance reduce the effect to 1% or less, eliminating history effect as a concern for such communication circuits. ©2007 IEEE.