Conference paper
Silicon nanoelectronics. The road less travelled
T.P. Smith III
SSDM 1991
We have observed fractional quantization of very few electrons confined in a semiconductor quantum dot using capacitance spectroscopy. The number of electrons per dot varies from 0 to about 40 as a function of bias on the quantum capacitors. The capacitance spectra have clear minima at gate voltages and magnetic fields, where the filling factors are 1/3 and 2/3. These measurements may allow direct comparison with few-particle calculations.
T.P. Smith III
SSDM 1991
Wu-Song Huang, R.W. Kwong, et al.
MRS Fall Meeting 1993
C.-K. Hu, K.Y. Lee, et al.
Thin Solid Films
T.P. Smith III, K.Y. Lee, et al.
Physical Review B