Paper
The DX centre
T.N. Morgan
Semiconductor Science and Technology
A feature of electron-energy-loss spectroscopy (EELS) in layered materials is predicted. Contrary to the usual isotropic case, EELS becomes temperature dependent. This result, obtained by using thermodynamic Greens functions, arises from the unusual structure of the layer plasmon bands. © 1991 The American Physical Society.
T.N. Morgan
Semiconductor Science and Technology
Xikun Hu, Wenlin Liu, et al.
IEEE J-STARS
R.J. Gambino, N.R. Stemple, et al.
Journal of Physics and Chemistry of Solids
Sharee J. McNab, Richard J. Blaikie
Materials Research Society Symposium - Proceedings