W.K. Chu, K.N. Tu
Applied Physics Letters
A grain-by-grain analysis of the microstructural evolution in Sn stripe under electromigration using synchrotron-based white beam x-ray microdiffraction was investigated. Grain-by-grain analysis was obtained from the diffracted Laue patterns about the changes of grain orientation before and after electromigration. It was observed that high-resistance grains reorient with respect to the neighboring low-resistance grains. A different mechanism of grain growth under electromigration from the normal grain growth was also proposed and discussed.
W.K. Chu, K.N. Tu
Applied Physics Letters
David R. Campbell, K.N. Tu, et al.
Thin Solid Films
M.O. Aboelfotoh, K.N. Tu
Physical Review B
R. Filippi, P.-C. Wang, et al.
IRPS 2009