PublicationMicroscopy and MicroanalysisPaperDiscussion of ways to energy-filter the electron backscattering pattern (EBSP) in the scanning electron microscope (SEM)Microscopy and MicroanalysisDownload paperAbstractNo abstract available.Home↳ PublicationsDate01 Nov 2002PublicationMicroscopy and MicroanalysisAuthorsOliver C. WellsIBM-affiliated at time of publicationResourcesPublicationShare
