Microscopy and Microanalysis

Paper

01 Nov 2002

Discussion of ways to energy-filter the electron backscattering pattern (EBSP) in the scanning electron microscope (SEM)

Abstract

No abstract available.

Paper

XY table and tilting stage for scanning electron microscope (SEM)

Oliver C. Wells

Review of Scientific Instruments

Paper

Magnetically filtered low-loss scanning electron microscopy

Oliver C. Wells, Eric Munro

Ultramicroscopy

Paper

Comparison of different models for the generation of electron backscattering patterns in the scanning electron microscope

Oliver C. Wells

Scanning

Paper

Application of the low-loss scanning electron microscope image to integrated circuit technology part II - Chemically-mechanically planarized samples

Oliver C. Wells, Maurice McGlashan-Powell, et al.

Scanning

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