PaperMethod for measuring the field from a magnetic recording head in the scanning electron microscopeOliver C. WellsJournal of Microscopy
PaperReduction of penetration effect at sharp edges in the scanning electron microscope (SEM)Oliver C. Wells, Phillip J. BaileyJournal of Microscopy
PaperLow-loss electron images of uncoated photoresist in the scanning electron microscopeOliver C. WellsApplied Physics Letters
PaperSchlieren method as applied to magnetic recording heads in the scanning electron microscopeOliver C. Wells, Matthias BrunnerApplied Physics Letters
