Microscopy and Microanalysis

Paper

01 Nov 2002

Discussion of ways to energy-filter the electron backscattering pattern (EBSP) in the scanning electron microscope (SEM)

Abstract

No abstract available.

Paper

Method for measuring the field from a magnetic recording head in the scanning electron microscope

Oliver C. Wells

Journal of Microscopy

Paper

Examining deep holes by rocking the beam in the scanning electron microscope

Oliver C. Wells

Review of Scientific Instruments

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Fundamental theorem for type‐1 magnetic contrast in the scanning electron microscope (SEM)

Oliver C. Wells

Journal of Microscopy

Paper

Reciprocity between the reflection electron microscope and the low-loss scanning electron microscope

Oliver C. Wells

Applied Physics Letters

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