David W. Abraham, Philip L. Trouilloud, et al.
IBM J. Res. Dev
Paper
Differential scanning tunnelling microscopy
Abstract
We review the principle of differential imaging and its application to scanning tunnelling microscopy (STM). It is shown that placing a lateral dither on an STM tip at high frequency provides the means for transfering topographic information to a frequency range where noise is small. Differential STM imaging on graphite and gold is demonstrated. A simple relation between the differential image and the conventional topographic image is described. 1988 Blackwell Science Ltd
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