Y. Martin, C.C. Williams, et al.
Journal of Applied Physics
Paper
Differential scanning tunnelling microscopy
Abstract
We review the principle of differential imaging and its application to scanning tunnelling microscopy (STM). It is shown that placing a lateral dither on an STM tip at high frequency provides the means for transfering topographic information to a frequency range where noise is small. Differential STM imaging on graphite and gold is demonstrated. A simple relation between the differential image and the conventional topographic image is described. 1988 Blackwell Science Ltd
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