W. Reuter, A. Lurio, et al.
Journal of Applied Physics
A search was made to observe a difference in the x-ray yield from equal velocity H+ and H2+ projectiles of 300-1200 keV/amu incident on thin metallic-film targets. Two different experimental techniques are described in which we observed x-rays arising from ionization of electrons with binding energies from 73 to 778 eV. To within the experimental uncertainty of approximately 1% no difference in yield could be detected. © 1978 The American Physical Society.
W. Reuter, A. Lurio, et al.
Journal of Applied Physics
B. Langa, D. Sapkota, et al.
AIP Advances
A. Lurio, E. Stern
Journal of Applied Physics
R.S. Freund, T.A. Miller, et al.
The Journal of Chemical Physics