J. Silverman, V. Dimilia, et al.
Microelectronic Engineering
The dc I-V characteristics of superconducting thin-film Sn-Au proximity bridges and uniform-thickness Sn microbridges have been carefully analyzed as a function of the directly measured current-phase relation (CPR). At sufficiently low dc current and voltage levels where heating and relaxation time effects are not important, the I-V characteristics are very well described by a shunted weak-link model that includes the proper dc CPR and a shunt resistance.
J. Silverman, V. Dimilia, et al.
Microelectronic Engineering
J.M. Warlaumont, J.C. Brown, et al.
Physical Review Letters
David Seeger, K.T. Kwietniak, et al.
Microelectronic Engineering
W.H. Henkels, N.C.-C. Lu, et al.
Workshop on Low Temperature Semiconductor Electronics 1989