Investigations of silicon nano-crystal floating gate memories
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
An approximate, analytical solution is derived for the minimum spacing that can exist between a series of parallel cracks propagating in a thin film. The analysis is pertinent to the specific case of a film and substrate having identical elastic properties. In the absence of plasticity, only three parameters govern the minimum crack spacing. The cracks are predicted to be more closely spaced if the film stress or the film thickness is increased, or if the fracture toughness of the film is decreased. Copyright © 1990, Wiley Blackwell. All rights reserved
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
Douglass S. Kalika, David W. Giles, et al.
Journal of Rheology
I. Morgenstern, K.A. Müller, et al.
Physica B: Physics of Condensed Matter
J. Tersoff
Applied Surface Science