Conference paper
A statistical critical path monitor in 14nm CMOS
Bruce Fleischer, Christos Vezyrtzis, et al.
ICCD 2016
Paper
Corroborating Cutoff Frequency Measurements with DC Gain Measurements
Abstract
A test for the correct measurement of cutoff frequency of bipolar transistors is described. The method tests the equality of the low frequency, small signal, current gain measured by network analyzer, and by dc current measurements. The method is described, and sample data are shown to demonstrate its practical application. © 1991 IEEE
Related
Joyce H. Wu, Jörg Scholvin, et al.
IEEE MWCL
Xiaoxiong Gu, Joel A. Silberman, et al.
IEEE Transactions on CPMT
Joachim N. Burghartz, Daniel C. Edelstein, et al.
IEEE T-MTT