About cookies on this site Our websites require some cookies to function properly (required). In addition, other cookies may be used with your consent to analyze site usage, improve the user experience and for advertising. For more information, please review your options. By visiting our website, you agree to our processing of information as described in IBM’sprivacy statement. To provide a smooth navigation, your cookie preferences will be shared across the IBM web domains listed here.
Publication
ECS Meeting 2018
Conference paper
Complementary III-V heterojunction tunnel FETs monolithically integrated on silicon
Abstract
The tunnel FET (TFET) is considered as one of the most promising devices for ultra-low power operation, and it is clear that heterojunction devices are required to achieve simultaneously steep slope and high on-current (Ion). However, technologically, heterojunction TFETs are much more complex than a silicon MOSFET. Our focus has been on dense monolithic integration of complementary III-V heterojunction TFETs on silicon, which may eventually evolve into a hybrid technology platform. In this paper we will give a general overview of the development of TFETs, discuss the challenges and opportunities both at the individual device level as well as in terms of technology development. In particular we will focus on the role of defects on device performance.