About cookies on this site Our websites require some cookies to function properly (required). In addition, other cookies may be used with your consent to analyze site usage, improve the user experience and for advertising. For more information, please review your options. By visiting our website, you agree to our processing of information as described in IBM’sprivacy statement. To provide a smooth navigation, your cookie preferences will be shared across the IBM web domains listed here.
Paper
Collective flux pinning, a probe of structural defects in amorphous superconducting films
Abstract
Two-dimensional collective pinning in sputtered amorphous films is a useful tool to study defects on the scale of the coherence length (∼7nm). In the asdeposited samples pinning was predominantly caused by quasi-dislocation loops. A change in the pinning characteristics was observed in some special cases: after annealing of the most inhomogeneous sample (thickness 3μm) at 580°C for 26h, and after doping of an annealed sample (thickness 0.5μm) with 0.2 at.% hydrogen. X-ray scattering experiments did not reveal any onset of recrystallization. The effects are discussed in terms of a second, relatively weak particle pin mechanism correlated with the stronger pins. © 1984.