Auger analysis of thin oxide films on Pb-In alloys

Abstract

The composition and stability of thin oxide films (≤ 35 Å), thermally grown on Pb-In alloy substrates at room temperature and various oxygen pressures, were studied quantitatively by Auger electron spectroscopy. The results indicate that all oxide films are enriched in indium in varying amounts, depending on the alloy composition and oxygen pressure. For alloys contaning more than 10 at.% In, the surface layer of the oxide consists of pure In 2O2 only; for alloys of lower In concentrations a mixture of PbO and In2O3, is formed. The mixed oxide appears to be unstable since the Auger data monitored during vacuum storage are indicative of the reduction of PbO with attendant formation of additional In 2O3 occuring near the alloy-oxide interface. Copyright © 1975 American Institute of Physics.