O.F. Schirmer, W. Berlinger, et al.
Solid State Communications
An electron microscope structure image of a Σ = 21/[111] tilt grain boundary in Au was obtained and atomic column positions identified to yield a structural unit model of the interface consisting of repeating polyhedron shapes. This result represents the smallest projected spacings at a grain boundary containing defect structures imaged by an electron microscope and interpreted atomistically. © 1990, Materials Research Society. All rights reserved.
O.F. Schirmer, W. Berlinger, et al.
Solid State Communications
A. Reisman, M. Berkenblit, et al.
JES
Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008