A. Gangulee, F.M. D'Heurle
Thin Solid Films
Atomically resolved scanning force microscopy images and force versus distance measurements at low temperatures on a cleaved NiO (001) single crystal are reported. The force-distance data are well modeled with a capacitive force in the distance range of 0.5 to 20 nm. The residual forces at smaller tip-sample distances show a maximum attraction of 2.3 nN and decay within 0.2 nm. They show a steplike behavior associated with an increase in dissipation signal. This steplike behavior can be explained by interaction of more than one atom of the tip or of the surface. © 2003 The American Physical Society.
A. Gangulee, F.M. D'Heurle
Thin Solid Films
Julien Autebert, Aditya Kashyap, et al.
Langmuir
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
Elizabeth A. Sholler, Frederick M. Meyer, et al.
SPIE AeroSense 1997