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This letter investigates random dopant fluctuation transistor mismatch. The dominance of the halo implant is demonstrated experimentally and with simulation, and a compact model form is developed for improved representation of the phenomenon. © 2008 IEEE.
Ruilong Xie, Pietro Montanini, et al.
IEDM 2016
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IEDM 2013
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IEDM 2014
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ICEE 2016