With increasing interleaving factors, the interleaver specifications become more stringent. Taking this into consideration, we have designed a bootstrapped switch for the first rank interleaver, which has a high tracking bandwidth with a broad input common mode voltage range (Fig. 1b). Moreover, we have utilized a modified class AB follower (Fig. 1c) as a first rank buffer which also addresses DC baseline wander.
Considering the balance between the speed and metastability, asynchronous successive approximation register (ASAR) ADC architecture is chosen as a sub-ADC (Fig. 1d). Differential memory cells are used within the ASAR to increase the robustness against the forbidden states and metastability.
Interleaving spurs are a critical limitation for time-interleaved ADCs degrading the resolution considerably. To address this, we have added a full foreground calibration capability to correct offset, gain, bandwidth and skew mismatch on chip.
The output data of each sub-ADC are sampled by 256 sample shift registers, which allows a total of 16k samples to be shifted out.
The layout and chip micrograph of the designed ADC are shown in Fig 2a. It achieves a state-of-the-art FoM of 47 fJ/conv.step with a total power dissipation of 240mW. The measured bandwidth is greater than 27 GHz. The ADC active area occupies 0.078mm.2
Sine tests result can be observed in Fig 3. The SNDR and SFDR are measured with a 0.2dB backoff from a 0.8VPPD (Fig. 3a). INL curve indicates a superior linearity achieved in Fig 3b. In Fig 3c the total harmonic distortion (THD) profile is shown for different input common mode values. The low frequency THD stays above -52dB in a 0.3V range which proves the robustness of the interleaver design against common mode variations. Finally, Fig. 3d shows the low frequency spectrum with 6.5 ENOB and an impressive THD of -60.6 dB.
The ADC is also tested using different modulation formats. For this purpose, the channel is extracted and equalized using FFE on the transmit side. The results of PAM4 and OFDM tests are shown in Fig 4. Fig 4a shows a 112 Gb/s PAM4 eye diagram captured with the ADC. It achieves 22dB SNDR and the captured bits are error free. Another promising experiment is with the 165Gb/s OFDM modulation the constellation of which is shown in Fig 4b.
The average channel SNDR is 22.6dB and the captured data with block coded modulation with an inner binary product code and outer RS KR4 code is error free. These measurements demonstrate the success of the designed ADC with spectrally efficient modulation formats.
Some possible directions for future related research include:
[1] S. Mirabbasi, L. C. Fujino and K. C. Smith, "Through the Looking Glass—The 2022 Edition: Trends in solid-state circuits from ISSCC," in IEEE Solid-State Circuits Magazine, vol. 14, no. 1, pp. 54-72, winter 2022, doi: 10.1109/MSSC.2021.3128243.