About cookies on this site Our websites require some cookies to function properly (required). In addition, other cookies may be used with your consent to analyze site usage, improve the user experience and for advertising. For more information, please review your options. By visiting our website, you agree to our processing of information as described in IBM’sprivacy statement. To provide a smooth navigation, your cookie preferences will be shared across the IBM web domains listed here.
Publication
ESSCIRC 2005
Conference paper
A novel circuit topology for generating and validating digitally sense amplifier differentials for bulk and SOI
Abstract
In this paper a novel programmable voltage divider circuit is proposed for converting digital signals to differential (analog) signals which can be used to evaluate differential sense amplifies in the absence of SRAM cells for the first time. The differentials can be programmable and switchable to reverse polarity. A circuit utilizing this scheme is also proposed to test variety of differential circuits having small signal inputs. The digital input is used to generate analog signals to drive the differential circuits; results are then validated digitally to alleviate more complicated testing problems. The novel circuit technique is implemented in hardware and test results are corroborated with simulations. The circuit functions both in bulk and Silicon on Insulator (SOI) technologies. © 2005 IEEE.