A detector system for studying nuclear reactions relevant to Single Event Effects

Abstract

We describe a device to study reactions relevant for the Single Event Effect (SEE) in microelectronics by means of 200 A and 300 A MeV, inverse kinematics, Si + H and Si + D reactions. The work is focused on the possibility to measure Z = 2 - 14 projectile fragments as efficiently as possible. During commissioning and first experiments the fourth quadrant of the CELSIUS storage ring acted as a spectrometer to register fragments in two planes of Si strip detectors in the angular region 0{ring operator} - 0 . 6{ring operator}. A combination of ring-structured and sector-structured Si strip detector planes operated at angles 0 . 6{ring operator} - 1 . 1{ring operator}. For specific event tagging a Si+ phoswich scintillator wall operated in the range 3 . 9{ring operator} - 11 . 7{ring operator} and Si Δ E - E telescopes of CHICSi type operated at large angles. © 2007 Elsevier B.V. All rights reserved.