200 and 300 MeV/nucleon nuclear reactions responsible for single-event effects in microelectronics
- H. Jäderström
- Yu. Murin
- et al.
- 2008
- Physical Review C - Nuclear Physics
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2 results for V. Kondratiev
A detector system for studying nuclear reactions relevant to Single Event Effects
- Yu. Murin
- Yu. Babain
- et al.
- 2007
- Nucl. Instrum. Methods Phys. Res