Opportunities and challenges of FinFET as a device structure candidate for 14nm node CMOS technologyTenko YamashitaVeeraraghvan S. Baskeret al.2011CSTIC 2011
Leakage engineering enabling PDSOI ring oscillators operating in sub-100pA/μm Ioff regimeZhibin RenJin Caiet al.2011CSTIC 2011
Plasma etch challenges for porous low k materials for 32nm and beyondCatherine LabelleR. Srivastavaet al.2011CSTIC 2011
Ultra-thin Body and BOX (UTBB) device for aggressive scaling of CMOS technologyQ. LiuA. Yagishitaet al.2011CSTIC 2011