Scaling challenges of semiconductor packaging in the era of big dataYasumitsu OriiAkihiro Horibeet al.2013IMAPS 2013
Heat sink induced thermo-mechanical joint strain in QFN devicesGerard McVickerVijay Khannaet al.2013IMAPS 2013
High thermal conductive inter chip fill for 3D-IC through pre-applied joining processY. KawaseM. Ikemotoet al.2013IMAPS 2013