Impact of Gate Stack Thermal Budget on NBTI Reliability in Gate-All-Around Nanosheet P-type DevicesHuimei ZhouMiaomiao Wanget al.2023IRPS 2023Conference paper
Experimental Study of Self-Heating Effect in InGaAs HEMTs for Quantum Technologies Down to 10KF. Serra Di Santa MariaF. Balestraet al.2023IRPS 2023Conference paper
Write-error-rate of Spin-Transfer-Torque MRAM (Invited)Daniel C. Worledge2023IRPS 2023Conference paper
Semantic Autoencoder for Modeling BEOL and MOL Dielectric Lifetime DistributionsWeiman YanErnest Wuet al.2023IRPS 2023Conference paper
Impact of Phase-Change Memory Drift on Energy Efficiency and Accuracy of Analog Compute-in-Memory Deep Learning Inference (Invited)Martin M. FrankNing Liet al.2023IRPS 2023Conference paper