Morphological transformations in the crystallization of TeSe-halide thin filmsA. BlatterC. Ortizet al.1993MRS Proceedings 1993
Elecromigration damage in fine Al alloy lines due to interfacial diffusionC.-K. HuM.B. Smallet al.1993MRS Proceedings 1993
Effect of annealing on the Cu distribution and Al2Cu precipitation in Al(Cu) thin filmsE.G. ColganK.P. Rodbellet al.1993MRS Proceedings 1993