Study of spalling behavior of Intel-metallic compounds during the reaction between electroless Ni-P metallization and lead-free soldersYoon-Chul SohnJin Yuet al.2004ECTC 2004
Thermal modeling of a small extreme power density macro on a high power density microprocessor chip in the presence of realistic packaging and interconnect structuresKai XiuMark Ketchen2004ECTC 2004
Silicon optical bench for high-speed optical subassembliesChristian BaksJeremy D. Schaubet al.2004ECTC 2004
Thermal impedance measurements of junction-down mounted single-side contact laser diodesGuy CohenLei Shanet al.2004ECTC 2004
Enabling technologies for wafer-level bonding of 3D MEMS and integrated circuit structuresAnna W. TopolBruce K. Furmanet al.2004ECTC 2004
120 Gb/s VCSEL-based parallel optical link and custom 120 Gb/s testing stationDaniel KuchtaYoung Kwarket al.2004ECTC 2004
Evaluation of thermal fatigue life and failure mechanisms of Sn-Ag-Cu solder joints with reduced Ag contentsSung K. KangPaul Lauroet al.2004ECTC 2004