Summary Abstract: The hexagonal reconstruction of Pt(100): A scanning tunneling microscopy studyR.J. BehmW. Hösieret al.1986JVSTAPaper
Time and angle resolved ultraviolet photoemission spectroscopy studies of single crystal surface and interfacesJ. BokorR.R. Freemanet al.1986JVSTAPaper
Effect of the sintering process on the formation and passivation of PtSiH.-C.W. HuangF.E. Tureneet al.1986JVSTAPaper
Characterization of nitrogen-containing glasses by x-ray photoelectron spectroscopyG.H. FrischatR. Fern1986JVSTAPaper
Nanosecond pulsed laser-induced segregation of Te in TeOx filmsW.-Y. LeeH. Coufalet al.1986JVSTAPaper
Low temperature material reaction at the Ti/Si(111) interfaceR.M. TrompG.W. Rubloffet al.1986JVSTAPaper
High resolution electron energy loss study of AlxGax_xAs mixed crystalsT. KuechM. Liehret al.1986JVSTAPaper
Reactively sputter-deposited and coevaporated TeOx thin films for optical recordingW.-Y. LeeF.O. Sequedaet al.1986JVSTAPaper