Threshold Voltage Characteristics of Depletion-Mode MOSFET's
- Matthew R. Wordeman
- Robert H. Dennard
- 1981
- IEEE T-ED
Publications
465 results at IEEE T-ED
Deep UV Photoresists I. Meldrum's Diazo Sensitizer
- Barbara D. Grant
- Nicholas J. Clecak
- et al.
- 1981
- IEEE T-ED
Dual-Electron-Injector-Structure Electrically Alterable Read-Only-Memory Modeling Studies
- D.J. Dimaria
- David W. Dong
- et al.
- 1981
- IEEE T-ED
Device Characterization of an Electron-Beam-Switched Thin-Film ZnS:Mn Electroluminescent Faceplate
- Omesh Sahni
- Paul M. Alt
- et al.
- 1981
- IEEE T-ED
Resolution and Linewidth Tolerances in Electron Beam and Optical Projection Lithography
- Tung Symon Chang
- David F. Kyser
- et al.
- 1981
- IEEE T-ED
RD3D 〈Computer Simulation of Resist Development in Three Dimensions〉
- Fletcher Jones
- Jurij Paraszczak
- 1981
- IEEE T-ED
I-2 Shallow Silicide Contact for Shallow Junction Devices
- K.N. Tu
- 1981
- IEEE T-ED
Josephson Edge-Junction Devices Using E-Beam Lithography
- Peter Vettiger
- David F. Moore
- et al.
- 1981
- IEEE T-ED
Resolution, Overlay, and Field Size for Lithography Systems
- Alec N. Broers
- 1981
- IEEE T-ED
Mesostructure Electronics
- Peter J. Price
- 1981
- IEEE T-ED