Chip-level power-performance optimization through thermally-driven across-chip variation (ACV) reduction
- X. Yu
- Oleg Gluschenkov
- et al.
- 2011
- IEDM 2011
Publications
Fundamental aspects of HfO 2-based high-k metal gate stack reliability and implications on t inv-scaling
- E. Cartier
- Andreas Kerber
- et al.
- 2011
- IEDM 2011
Properties of phase change materials modified by ion implantation
- Simone Raoux
- Guy M. Cohen
- et al.
- 2011
- MRS Spring Meeting 2011
Novel heterojunction solar cells with conversion efficiencies approaching 21% on p-type crystalline silicon substrates
- Bahman Hekmatshoar
- Davood Shahrjerdi
- et al.
- 2011
- IEDM 2011
SystemT: A declarative Information Extraction system
- Yunyao Li
- Frederick R. Reiss
- et al.
- 2011
- ACL 2011
Impact of TDDB in MG/HK devices on circuit functionality in advanced CMOS technologies
- Andreas Kerber
- D. Lipp
- et al.
- 2011
- IEDM 2011
New layout dependency in high-k/metal gate MOSFETs
- M. Hamaguchi
- Deleep R. Nair
- et al.
- 2011
- IEDM 2011
Graphene technology with inverted-T gate and RF passives on 200 mm platform
- Shu-Jen Han
- Alberto Valdes-Garcia
- et al.
- 2011
- IEDM 2011
Learning sub-word units for open vocabulary speech recognition
- Carolina Parada
- Mark Dredze
- et al.
- 2011
- ACL 2011
Hardware-assisted 3D TCAD for predictive capacitance extraction in 32nm SOI SRAMs
- Ajay N. Bhoj
- Rajiv Joshi
- et al.
- 2011
- IEDM 2011