Publications

13 results at VLSI Technology 2006

RTA-driven intra-die variations in stage delay, and parametric sensitivities for 65nm technology
- - I. Ahsan
  - N. Zamdmer
  - et al.
- 2006
- VLSI Technology 2006
Conference paper
A comparative study of NBTI and PBTI (Charge Trapping) in SiO ₂/HfO₂ stacks with FUSI, TiN, Re gates
- - S. Zafar
  - Y.-H. Kim
  - et al.
- 2006
- VLSI Technology 2006
Conference paper
Poly-Si/AlN/HfSiO stack for ideal threshold voltage and mobility in sub-100 nm MOSFETs
- - K.-L. Lee
  - M.M. Frank
  - et al.
- 2006
- VLSI Technology 2006
Conference paper